© Abrel Products Limited 2010 January 2010       Abrel exhibits at Bits 2010            Abrel will once again be exhibiting at the BiTS 2010 EXPO. The event will take place from Mar 07-10 2010 at the Hilton Hotel, Mesa, Arizona.   Abrel will be showcasing their full product range including their market-leading Burn-in Board test system, the Bibtest55XL. About BiTS - This is the world’s premier workshop dedicated to providing a forum for the latest information about burn-in and test socketing, and related fields. The workshop brings together over 400 attendees, representing more than 100 companies from around the world, and more than 50 exhibitors. For more information visit www.bitsworkshop.org                                              September 2009       Abrel offers innovative solutions for WLCSP Burn-in               Abrel has expanded its product offerings to include innovative turnkey solutions for Wafer Level burn-in. The latest technology includes carrier boards, WLCSP device mounting, carrier sockets for burn-in and HAST. Devices can be accepted on tape and delivered on carrier boards ready for the burn-in process. Please contact Abrel for more information, or to discuss your specific requirements.                                                                  November 2009       Test Probes for fine pitch sockets As part of Abrel’s continued development on test probe technology, the company can now supply socket test probes for applications with 0.5mm pitch and lower. Probes can be supplied for a full range of fine pitch package types including CSP, QFP, SOP and QFN. To request further information, please contact you local sales office, or email info@abrel.com.   March 2010       Ver2.0 update for Bibtest55XL           Abrel are pleased to announce a new release Ver2.0 to the Bibtest55XL burn-in board test system. The new features will further enhance the      testing and programming capability of the Ver1.0 Bibtest55XL, the market leader in burn-in board testing. Some of the new features include; significantly increased test speeds, upgraded zone programming for high density boards, improved leakage measurements, simpler capacitor offset learning, SPC data gathering (to monitor component drift over time), improved data logging and live socket pass/fail status. The existing Ver1.0 system can be fully upgraded on-site toVer2.0. To request further information or to view a demonstration of the Bibtest55XL, please contact you local sales office, or email info@abrel.com   February 2010       Abrel awarded ISO9001:2008 quality mark           Abrel are pleased to announce that on the 15th February 2010 the company was recertified to the latest IS09001:2008 quality standard, and becomes one of the first companies in Ireland to achieve this standard. The accreditation was completed by NQA, one of the leading assessment, verification and certification bodies. On receiving the accreditation, Declan Brosnan, Sales Director with Abrel, stated that the key benefits of ISO9001:2008 within the organisation included defined procedures, quality measurements and improved efficiencies. To view a copy of the certificate please click here