The Burn-in & Test Strategies (BiTS) Workshop may have rebranded as TestConX but rest assured it’s going to be the same great event!
Abrel is flying out to the US and Declan Brosnan and Paul Comerford are looking forward to meeting up with lots of our clients at TestConX.
TestConX is the worlds premier event for test and burn-in and a must on the calendar for Abrel each year.
TextConX is back at Mesa in Arizona and runs from 3rd to 6th March 2019. Last year’s BiTS workshop was a lot of fun and Abrel was featured at the event. Analog Devices presented their research paper which featured technology produced by Abrel during their presentation on Low Voltage Differential Signal (LVDS) Burn-In.
Over 100 companies were in attendance in 2018 which was fantastic, and we made lots of new connections.
This year TestConX begins on Sunday the 3rd March and there’s a jam packed line-up of speakers, workshops and technical sessions.
We’re looking forward to hearing from Michael Campbell, Senior Vice President of Engineering at Qualcomm Technologies. Michael is giving the Keynote speech titled “Test Challenges Accepted: Billions of Transistors, 5G Mobile, and End-to-end Quality” on Monday morning – a very current topic for discussion right now. The complexity of mobile phones now includes digital integrated circuits supporting billions of transistors and millimetre-wave technology in 5G phones.
Throughout the week there’s a variety of different technical sessions being held and if you are attending your first TestConX we would strongly recommend attending some of them.
If you are attending the conference this year and would like to meet up with us please don’t hesitate to get in touch. Send us a short message and we’ll get back to you to arrange a meeting.